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Electronic Diagnostic and Test Equipment Reports
 
Improving regulatory compliance management through log analysis, SIM
sponsored by HP Enterprise Security
EGUIDE: This E-Guide highlights the importance of log analysis and security information and event management (SIEM) in improving regulatory compliance management.
Posted: 30 Mar 2012 | Published: 30 Mar 2012

HP Enterprise Security

IEEE 1149.1 Use in Design for Verification and Testability at Texas Instruments
sponsored by Texas Instruments, Inc.
WHITE PAPER: This document introduces those products that include ASIC cells, standard interface ICs, a bus master IC, a controller interface board for IBM compatibles, a high-speed scan interface, and software to control the scan bus.
Posted: 17 Mar 2002 | Published: 05 May 2000

Texas Instruments, Inc.

Automation in Agile ALM: Interview with author Michael Hüttermann -- Part 1
sponsored by IBM
EGUIDE: Automation is often touted as a key in successful application development efforts, but it comes in many different flavors. This tip guide describes the variety of automation techniques and benefits of using automation throughout the application development lifecycle.
Posted: 28 Nov 2011 | Published: 07 Nov 2011

IBM

Is automated testing replacing the software tester?
sponsored by IBM
EGUIDE: With increased use of automation in application lifecycle management (ALM), the role of the tester is changing. In this tip guide managers will get advice on what to look for when selecting automated test tools and will learn more about how they may best want to invest their testing dollars in automation.
Posted: 28 Nov 2011 | Published: 07 Nov 2011

IBM

Six tips for selecting automated test tools for Agile development
sponsored by IBM
EGUIDE: With increased use of automation in application lifecycle management (ALM), the role of the tester is changing. In this tip guide managers will get advice on what to look for when selecting automated test tools and will learn more about how they may best want to invest their testing dollars in automation.
Posted: 28 Nov 2011 | Published: 07 Nov 2011

IBM

Design-for-Test Analysis of a Buffered SDRAM DIMM
sponsored by Texas Instruments, Inc.
WHITE PAPER: This document presents a design-for-test analysis of a buffered synchronous dynamic random access memory dual in-line memory module.
Posted: 11 Mar 2002 | Published: 13 Aug 1996

Texas Instruments, Inc.

LogRhythm and NERC CIP Compliance
sponsored by LogRhythm, Inc.
WHITE PAPER: LogRhythm has extensive experience in helping organizations improve their overall security and compliance posture while reducing costs, it automatically performs the first level of log analysis and also ensures you to meet your reporting requirements.
Posted: 25 Jul 2008 | Published: 01 Jul 2008

LogRhythm, Inc.

Built-in Self-test (BIST) Using Boundary Scan
sponsored by Texas Instruments, Inc.
WHITE PAPER: This document shows how existing architectures can be modified to conform to IEEE 1149.1 architecture.
Posted: 09 May 2000 | Published: 01 Dec 1996

Texas Instruments, Inc.

Strategic Planning for Enterprise-wide Test Automation
sponsored by CSC
WHITE PAPER: In this resource, discover how you can achieve large-scale test automation throughout the application lifecycle by leveraging a test automation platform. Read on to discover the features, benefits, and components of this technology.
Posted: 16 Sep 2013 | Published: 31 Dec 2012

CSC

Veeam + HPE Nimble Storage: Five-Year ROI of 278%
sponsored by Veeam Software
WHITE PAPER: IDC interviewed organizations supporting their data backup and recovery environments with Veeam Cloud Data Management software combined with HPE Nimble Storage to see how it performed. Read this IDC white paper to learn the 8 benefits of this combined solution and see the results that customers experienced.
Posted: 29 Jan 2020 | Published: 29 Jan 2020

Veeam Software
 

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