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National Instruments Synchronization and Memory Core - A Modern Architecture for Mixed Signal Test sponsored by National Instruments WHITE PAPER: By providing a common architecture for the 100 MS/s mixed-signal prototyping a test suite of instruments, the SMC enables the instruments to test systems where digital and analog signals are side by side. Posted: 28 Aug 2003 \| Published: 01 Jul 2003 TOPICS: Architectures \| Diagnostic and Test Hardware \| Hardware Testing \| Memory \| Prototyping \| Systems Testing

Lowering the Cost of Test with Integrated Switch Management sponsored by National Instruments WHITE PAPER: National Instruments Switch Executive is a significant innovation in the design and implementation of automated test systems. Posted: 02 Sep 2002 \| Published: 01 Feb 2002 TOPICS: Diagnostic and Test Hardware \| Diagnostic and Test Software \| Systems Management Software \| Systems Testing

Strategies for Lowering the Cost of Manufacturing Test sponsored by National Instruments WHITE PAPER: NI platform offers high test throughput, increased productivity, and a lower cost of ownership than traditional disjoint systems or turnkey solutions based on proprietary architectures. Posted: 02 Sep 2002 \| Published: 01 May 2001 TOPICS: Diagnostic and Test Hardware \| Diagnostic and Test Software \| Manufacturing Systems \| Systems Testing \| TCO

Diagnostic and Test Hardware Reports