Barcode Scanners Reports

Advanced RFID Measurements: Basic Theory to Protocol Conformance Test
sponsored by National Instruments
WHITE PAPER: As RFID adoption continues to grow, engineers are faced with an increasing need to validate tags both for interoperability with products from other vendors and for conformance with the specified protocol.
Posted: 21 Jul 2008 | Published: 01 Jan 2006

National Instruments

First edition of Computer Weekly 1966
sponsored by TechTarget ComputerWeekly.com
EBOOK: To celebrate Computer Weekly's 50th anniversary, the National Museum of Computing, which holds the print archives of the magazine, has scanned the first issue of Computer Weekly. We have made this available to download.
Posted: 08 Feb 2021 | Published: 09 Sep 2016

TechTarget ComputerWeekly.com

Computer Weekly - 13 December 2022: AI experts question tech industry's ethical commitments
sponsored by TechTarget ComputerWeekly.com
EZINE: In this week's Computer Weekly, the proliferation of ethical frameworks has done little to change how artificial intelligence is developed – we look at the challenges. We examine the future of the UK semiconductor sector as the government launches a review. And we hear how NatWest has put data at the heart of customer strategy. Read the issue now.
Posted: 13 Dec 2022 | Published: 13 Dec 2022

TechTarget ComputerWeekly.com

Does a proprietary solution automatically mean vendor lock-in?
sponsored by TechTarget ComputerWeekly.com
ANALYST REPORT: The dread of any IT manager is in making a significant purchase of hardware or software to then find that they are 'locked in' to one supplier. But analyst Clive Longbottom asks, is this still the case?
Posted: 08 Feb 2021 | Published: 14 Mar 2016

TechTarget ComputerWeekly.com

Computer Weekly 50th anniversary special
sponsored by TechTarget ComputerWeekly.com
EZINE: It's been 50 years since Computer Weekly's launch on 22 September 1966. To mark this achievement, we have compiled a special edition of the magazine to reflect on how much the British technology industry has contributed over that time.
Posted: 08 Feb 2021 | Published: 22 Sep 2016

TechTarget ComputerWeekly.com

First the Tick, Now the Tock: Next Generation Intel Microarchitecture - Nehalem
sponsored by Intel Corporation
WHITE PAPER: Read this paper and get a look at how the next generation microarchitecture's dynamically scalable and design-scalable features directly contribute to power efficiency and performance.
Posted: 03 Apr 2009 | Published: 02 Apr 2009

Intel Corporation

Prototyping Data Warehouses Using Visual Analytics: Presentation Transcript
sponsored by Tableau Software
PRESENTATION TRANSCRIPT: Read this presentation transcript of the “Prototyping Data Warehouses using Visual Analytics” webinar that includes a case study demonstrating how the City of Charlotte is administering Tableau Server to reduce IT intervention, reduce costs and increase collaboration between business units.
Posted: 09 Apr 2009 | Published: 09 Apr 2009

Tableau Software

System Recovery-Breaking through the Dissimilar Hardware Restore Challenge
sponsored by Symantec Corporation
WHITE PAPER: This paper discusses how Symantec Backup Exec System Recovery Restore Anyware can dramatically change the way organizations perform a wide range of IT tasks, including bare-metal system recovery and restoration to dissimilar hardware.
Posted: 20 Mar 2008 | Published: 01 Dec 2007

Symantec Corporation

Integrating HP Data Protector Software with HP Data Deduplication Solutions
sponsored by HP Inc
WHITE PAPER: This white paper will discuss HP Data Protector Software which fully supports HP data deduplication technologies allowing you to recover files more quickly while reducing your data management and storage costs.
Posted: 10 Dec 2008 | Published: 10 Dec 2008

HP Inc

Going Parallel with LabVIEW Delivers Throughput Gains
sponsored by National Instruments
WHITE PAPER: In this whitepaper learn how by combining technologies with NI Lab VIEW parallel programming software and NI TestStand test management software, test engineers can create high-performance test systems.
Posted: 16 Sep 2008 | Published: 16 Sep 2008

National Instruments