IT Management  >   Systems Design and Development  >   Testing  >  

Hardware Testing

RSS Feed   
DEFINITION: A common test platform (CTP), also called an open test standard (OTS), is a set of specifications defining test methods for diverse components of computer and electronic systems to be marketed as complete products. The intent of a CTP is to ensure consistency in hardware and software test procedures from the conceptual and design phases through manufacture and distribution.Computers, computer peripherals  … 

Hardware Testing definition sponsored by SearchWinDevelopment.com, powered by WhatIs.com an online computer dictionary
Hardware Testing Reports
4 Matches
How Can Semiconductor Firms Cut Design Costs and Shorten Time-To-Market?
sponsored by IBM
RESOURCE: This resource explores the effectiveness of a set of electronic design automation (EDA) tools for semiconductor chip designers. Find out how to accelerate the delivery of high-quality processors to the market faster and more cost-effectively.
Posted: 20 Sep 2016 | Published: 20 Sep 2016

IBM

What can go wrong with counterfeit parts : What unauthorized support providers don't tell you - Government Finance customer
sponsored by Hewlett Packard Enterprise
CASE STUDY: Read through this concise case study to find out how HP resolved an organization's data loss issues, when it was discovered their hardware was not genuine HP parts.
Posted: 24 Jan 2014 | Published: 30 Nov 2013

Hewlett Packard Enterprise

Putting Windows 7 Migration on the Fast Track
sponsored by BDNA
WHITE PAPER: The Windows 7 migration will soon be a reality for nearly every organization. And while the migration process can present many challenges, BDNA technologies can provide a fully transparent view into the entire infrastructure, reducing the risks and costs of migration. Read now to ensure your migration is efficient and cost-effective.
Posted: 07 Jun 2011 | Published: 07 Jun 2011

BDNA

National Instruments Synchronization and Memory Core - A Modern Architecture for Mixed Signal Test
sponsored by National Instruments
WHITE PAPER: By providing a common architecture for the 100 MS/s mixed-signal prototyping a test suite of instruments, the SMC enables the instruments to test systems where digital and analog signals are side by side.
Posted: 28 Aug 2003 | Published: 01 Jul 2003

National Instruments
4 Matches

About TechTarget:

TechTarget provides enterprise IT professionals with the information they need to perform their jobs - from developing strategy, to making cost-effective IT purchase decisions and managing their organizations' IT projects - with its network of technology-specific Web sites, events and magazines

All Rights Reserved, Copyright 2000 - 2018, TechTarget | Read our Privacy Statement