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DEFINITION: A common test platform (CTP), also called an open test standard (OTS), is a set of specifications defining test methods for diverse components of computer and electronic systems to be marketed as complete products. The intent of a CTP is to ensure consistency in hardware and software test procedures from the conceptual and design phases through manufacture and distribution.Computers, computer peripherals  … 

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Hardware Testing White Papers (View All Report Types)
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Putting Windows 7 Migration on the Fast Track
sponsored by BDNA
WHITE PAPER: The Windows 7 migration will soon be a reality for nearly every organization. And while the migration process can present many challenges, BDNA technologies can provide a fully transparent view into the entire infrastructure, reducing the risks and costs of migration. Read now to ensure your migration is efficient and cost-effective.
Posted: 07 Jun 2011 | Published: 07 Jun 2011

BDNA

National Instruments Synchronization and Memory Core - A Modern Architecture for Mixed Signal Test
sponsored by National Instruments
WHITE PAPER: By providing a common architecture for the 100 MS/s mixed-signal prototyping a test suite of instruments, the SMC enables the instruments to test systems where digital and analog signals are side by side.
Posted: 28 Aug 2003 | Published: 01 Jul 2003

National Instruments
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