National Instruments Synchronization and Memory Core - A Modern Architecture for Mixed Signal Test

National Instruments Synchronization and Memory Core - A Modern Architecture for Mixed Signal Test

Cover

By providing a common architecture for the 100 MS/s mixed-signal prototyping a test suite of instruments, the SMC enables the instruments to test systems where digital and analog signals are side by side. Emphasis on tight timing and synchronization, deep and flexible onboard memory, and fully programmable data transfer cores, makes the SMC an excellent foundation for a mixed-signal modular instrumentation test platform for today and the future.

Vendor:
National Instruments
Posted:
Aug 28, 2003
Published:
Jul 1, 2003
Format:
PDF
Type:
White Paper
Already a Bitpipe member? Login here

Download this White Paper!