Diagnostic Software White Papers

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Reducing Risk through Requirements-driven Quality Management: An End-to-End Approach
sponsored by Hewlett Packard Enterprise
WHITE PAPER: Read this white paper to learn a structured way to manage requirements, and how risk-based requirements and quality management are inseparable from the larger process of managing the planning, test and release of a software system.
Posted: 14 Jun 2007 | Published: 01 May 2007

Hewlett Packard Enterprise

Lowering the Cost of Test with Integrated Switch Management
sponsored by National Instruments
WHITE PAPER: National Instruments Switch Executive is a significant innovation in the design and implementation of automated test systems.
Posted: 02 Sep 2002 | Published: 01 Feb 2002

National Instruments

Strategies for Lowering the Cost of Manufacturing Test
sponsored by National Instruments
WHITE PAPER: NI platform offers high test throughput, increased productivity, and a lower cost of ownership than traditional disjoint systems or turnkey solutions based on proprietary architectures.
Posted: 02 Sep 2002 | Published: 01 May 2001

National Instruments

Proactive PC Support Improves Service and Lowers Total Cost of Ownership
sponsored by Intel Corporation
WHITE PAPER: Read this brief paper to learn about a new IT support delivery tool that reduces response time, boosts employee satisfaction and decreases operating costs. Reduce total cost of ownership using Intel's self-service PC Health Check utility.
Posted: 02 Apr 2009 | Published: 01 Jan 2009

Intel Corporation

Total Economic Impact of Oracle Enterprise Manager Database Management Packs
sponsored by Oracle Corporation
WHITE PAPER: This study highlights the benefits and costs of deploying the Oracle Enterprise Manager Diagnostic Pack and Tuning Pack across the enterprise of a sample organization. The study examines the estimated ROI for the sample organization and presents aggregate findings derived from the interview and analysis process and Forrester's independent research.
Posted: 18 Mar 2009 | Published: 18 Feb 2008

Oracle Corporation

Improve Test Productivity and Product Quality through Test Management
sponsored by TechExcel
WHITE PAPER: QA organizations are under increasing pressure to complete their testing in ever-shorter time frames. To meet these challenges, these organizations are pursuing several different strategies to accomplish their goals.
Posted: 12 Mar 2007 | Published: 01 Mar 2007

TechExcel

Automated Testing -- Preventing DOA for SOA
sponsored by Worksoft
WHITE PAPER: SOA is being proclaimed the future of Web services - While promising flexibility and integration, unique and unforeseen challenges to stability and quality are also arising. Is your organization prepared?
Posted: 01 Dec 2005 | Published: 01 Dec 2004

Worksoft

Reduce IT Costs and Complexity with Effective Application Problem Management
sponsored by BMC Software, Extending Value with Identify Software
WHITE PAPER: Learn the benefits of automating problem management through problem detection, isolation and resolution. Discover how IT organizations can reduce IT costs and complexity with effective application problem management.
Posted: 26 Mar 2007 | Published: 01 Nov 2006

BMC Software, Extending Value with Identify Software

Faster SQL Profiling for Better Database Performance
sponsored by Embarcadero Technologies, Inc.
WHITE PAPER: Find out how Embarcadero's DB Optimizer™ can help you to quickly discover and fix problematic SQL statements that can cause performance bottlenecks in your database. DB Optimizer™ gives you the flexibility of using a single easy-to-use IDE to test, profile and tune SQL.
Posted: 16 Apr 2009 | Published: 16 Apr 2009

Embarcadero Technologies, Inc.

Improving Manufacturing Quality with Integrated Test and Statistical Analysis
sponsored by National Instruments
WHITE PAPER: With test management and statistical analysis integrated into an automated system, organizations can target problem components and processes in less time with more accuracy, reducing the cost of manufacturing quality products.
Posted: 01 Dec 2002 | Published: 01 Nov 2002

National Instruments