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Log Analytics: Simplifying Complex IT Environments
sponsored by VMware, Inc.
WHITE PAPER: Access this white paper for interviews with IT operations teams looking for better ways to effectively collect, analyze, and harness key information from logs in today's complex IT environment.
Posted: 17 Oct 2013 | Published: 17 Oct 2013

VMware, Inc.

IEEE 1149.1 Use in Design for Verification and Testability at Texas Instruments
sponsored by Texas Instruments, Inc.
WHITE PAPER: This document introduces those products that include ASIC cells, standard interface ICs, a bus master IC, a controller interface board for IBM compatibles, a high-speed scan interface, and software to control the scan bus.
Posted: 17 Mar 2002 | Published: 05 May 2000

Texas Instruments, Inc.

Six tips for selecting automated test tools for Agile development
sponsored by IBM
EGUIDE: With increased use of automation in application lifecycle management (ALM), the role of the tester is changing. In this tip guide managers will get advice on what to look for when selecting automated test tools and will learn more about how they may best want to invest their testing dollars in automation.
Posted: 28 Nov 2011 | Published: 07 Nov 2011

IBM

Built-in Self-test (BIST) Using Boundary Scan
sponsored by Texas Instruments, Inc.
WHITE PAPER: This document shows how existing architectures can be modified to conform to IEEE 1149.1 architecture.
Posted: 09 May 2000 | Published: 01 Dec 1996

Texas Instruments, Inc.

Automation in Agile ALM: Interview with author Michael Hüttermann -- Part 1
sponsored by IBM
EGUIDE: Automation is often touted as a key in successful application development efforts, but it comes in many different flavors. This tip guide describes the variety of automation techniques and benefits of using automation throughout the application development lifecycle.
Posted: 28 Nov 2011 | Published: 07 Nov 2011

IBM

Design-for-Test Analysis of a Buffered SDRAM DIMM
sponsored by Texas Instruments, Inc.
WHITE PAPER: This document presents a design-for-test analysis of a buffered synchronous dynamic random access memory dual in-line memory module.
Posted: 11 Mar 2002 | Published: 13 Aug 1996

Texas Instruments, Inc.

Is automated testing replacing the software tester?
sponsored by IBM
EGUIDE: With increased use of automation in application lifecycle management (ALM), the role of the tester is changing. In this tip guide managers will get advice on what to look for when selecting automated test tools and will learn more about how they may best want to invest their testing dollars in automation.
Posted: 28 Nov 2011 | Published: 07 Nov 2011

IBM

Strategic Planning for Enterprise-wide Test Automation
sponsored by CSC
WHITE PAPER: In this resource, discover how you can achieve large-scale test automation throughout the application lifecycle by leveraging a test automation platform. Read on to discover the features, benefits, and components of this technology.
Posted: 16 Sep 2013 | Published: 31 Dec 2012

CSC

Automated Log Management for Hybrid Cloud Environments
sponsored by VMware, Inc.
WHITE PAPER: In this white paper, discover a log management tool that addresses the needs of today's dynamic environment by providing quality of service, operational efficiency, and compliance features for optimum infrastructure and application service levels.
Posted: 18 Oct 2013 | Published: 13 May 2013

VMware, Inc.

Unclutter Your Data Center With Consolidated Log Management
sponsored by VMware, Inc.
WHITE PAPER: In this white paper, explore a consolidated logging system to avoid the risks that may occur in a complex IT environment, and feel confident in running a reliable and secure virtual data center.
Posted: 17 Oct 2013 | Published: 13 Jun 2013

VMware, Inc.
 
 
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