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Electronic Inspection and Monitoring Instruments Reports
 
Silk Test, the bug buster: Automate test scripts for multiple applications and networks
sponsored by Borland, Micro Focus
WHITE PAPER: This white paper introduces an automated testing technology that makes application testing fast, easy, and accessible for even the most non-technical users.
Posted: 06 May 2013 | Published: 06 May 2013

Borland, Micro Focus

A Rational approach to integration testing
sponsored by IBM
WHITE PAPER: Learn strategic approaches to integration testing that will mitigate the risks of system change and improve quality.
Posted: 27 Aug 2012 | Published: 31 Jul 2012

IBM

Design-for-Test Analysis of a Buffered SDRAM DIMM
sponsored by Texas Instruments, Inc.
WHITE PAPER: This document presents a design-for-test analysis of a buffered synchronous dynamic random access memory dual in-line memory module.
Posted: 11 Mar 2002 | Published: 13 Aug 1996

Texas Instruments, Inc.

Improving regulatory compliance management through log analysis, SIM
sponsored by HP Enterprise Security
EGUIDE: This E-Guide highlights the importance of log analysis and security information and event management (SIEM) in improving regulatory compliance management.
Posted: 30 Mar 2012 | Published: 30 Mar 2012

HP Enterprise Security

IEEE 1149.1 Use in Design for Verification and Testability at Texas Instruments
sponsored by Texas Instruments, Inc.
WHITE PAPER: This document introduces those products that include ASIC cells, standard interface ICs, a bus master IC, a controller interface board for IBM compatibles, a high-speed scan interface, and software to control the scan bus.
Posted: 17 Mar 2002 | Published: 05 May 2000

Texas Instruments, Inc.

Automation in Agile ALM: Interview with author Michael Hüttermann -- Part 1
sponsored by IBM
EGUIDE: Automation is often touted as a key in successful application development efforts, but it comes in many different flavors. This tip guide describes the variety of automation techniques and benefits of using automation throughout the application development lifecycle.
Posted: 28 Nov 2011 | Published: 07 Nov 2011

IBM

Built-in Self-test (BIST) Using Boundary Scan
sponsored by Texas Instruments, Inc.
WHITE PAPER: This document shows how existing architectures can be modified to conform to IEEE 1149.1 architecture.
Posted: 09 May 2000 | Published: 01 Dec 1996

Texas Instruments, Inc.

Test Automation: Exploring Automation Case Studies in Agile Development
sponsored by Micro Focus
EGUIDE: Read this article to hear from experts Dorothy Graham and Mark Fewster as they discuss the takeaways from 28 test automation case studies in agile application development. Learn how you can implement test automation in your organization quickly and easily.
Posted: 02 May 2012 | Published: 02 May 2012

Micro Focus

Is automated testing replacing the software tester?
sponsored by IBM
EGUIDE: With increased use of automation in application lifecycle management (ALM), the role of the tester is changing. In this tip guide managers will get advice on what to look for when selecting automated test tools and will learn more about how they may best want to invest their testing dollars in automation.
Posted: 28 Nov 2011 | Published: 07 Nov 2011

IBM

Eradicate Cross-Site Scripting
sponsored by Veracode, Inc.
WHITE PAPER: The rise of e-commerce has generated a concurrent surge of Internet crime into a multi-billion-a-year industry, as criminals follow the money, the countless potential online victims and the vulnerability of web applications to easy exploitation.
Posted: 28 Feb 2011 | Published: 28 Feb 2011

Veracode, Inc.
 
 
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