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May 22, 2013
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| All resources sponsored by: |
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Texas Instruments, Inc. |
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| 5 Matches |
TMS320C6000 Memory Test
| sponsored by Texas Instruments, Inc.
APPLICATION NOTE:This set of programs has been compiled to provide a way to verify the integrity of internal DSP memory and external system memory for all devices currently in the TMS320C6000 (C6000) family. Posted: 27 Mar 2002 | Published: 01 Feb 2002
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IEEE 1149.1 Use in Design for Verification and Testability at Texas Instruments
| sponsored by Texas Instruments, Inc.
WHITE PAPER:This document introduces those products that include ASIC cells, standard interface ICs, a bus master IC, a controller interface board for IBM compatibles, a high-speed scan interface, and software to control the scan bus. Posted: 17 Mar 2002 | Published: 05 May 2000
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Design-for-Test Analysis of a Buffered SDRAM DIMM
| sponsored by Texas Instruments, Inc.
WHITE PAPER:This document presents a design-for-test analysis of a buffered synchronous dynamic random access memory dual in-line memory module. Posted: 11 Mar 2002 | Published: 13 Aug 1996
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Built-in Self-test (BIST) Using Boundary Scan
| sponsored by Texas Instruments, Inc.
WHITE PAPER:This document shows how existing architectures can be modified to conform to IEEE 1149.1 architecture. Posted: 09 May 2000 | Published: 01 Dec 1996
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FIFO Solutions for Increasing Clock Rates and Data Widths: First-in, First-out Technology
| sponsored by Texas Instruments, Inc.
WHITE PAPER:Steady increases in microprocessor operating frequencies and bus widths over recent years have challenged system designers to find FIFO memories that meet their needs. Posted: 13 Apr 2000 | Published: 01 Jan 1996
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