Diagnostic and Test Hardware Reports

National Instruments Synchronization and Memory Core - A Modern Architecture for Mixed Signal Test
sponsored by National Instruments
WHITE PAPER: By providing a common architecture for the 100 MS/s mixed-signal prototyping a test suite of instruments, the SMC enables the instruments to test systems where digital and analog signals are side by side.
Posted: 28 Aug 2003 | Published: 01 Jul 2003

National Instruments

Lowering the Cost of Test with Integrated Switch Management
sponsored by National Instruments
WHITE PAPER: National Instruments Switch Executive is a significant innovation in the design and implementation of automated test systems.
Posted: 02 Sep 2002 | Published: 01 Feb 2002

National Instruments

Strategies for Lowering the Cost of Manufacturing Test
sponsored by National Instruments
WHITE PAPER: NI platform offers high test throughput, increased productivity, and a lower cost of ownership than traditional disjoint systems or turnkey solutions based on proprietary architectures.
Posted: 02 Sep 2002 | Published: 01 May 2001

National Instruments