sponsored by Texas Instruments, Inc.
Posted:  17 Mar 2002
Published:  05 May 2000
Format:  PDF
Length:  6  Page(s)
Type:  White Paper
Language:  English
ABSTRACT:
Some new products aimed at standardizing and reducing the cost of integrated circuit (IC) system test and debug are compatible with IEEE 1149.1. This document introduces those products that include ASIC cells, standard interface ICs, a bus master IC, a controller interface board for IBM compatibles, a high-speed scan interface, and software to control the scan bus. A detailed evaluation of trade-offs when using the IEEE 1149.1 standard for ASIC testability is presented. This document is reprinted with the permission of the IEEE.



Author

Adam Cron



BROWSE RELATED RESOURCES
ASIC | Circuit Design | Integrated Circuit Test Equipment | Standards | Testing

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