Built-in Self-test (BIST) Using Boundary Scan

Built-in Self-test (BIST) Using Boundary Scan

Cover
The IEEE standard boundary scan framework and four-wire serial testablity are having a positive impact on testing all levels of electronic assembly. The two form a basis from which other techniques are developed to facilitate testing of chips and systems. This document shows how existing architectures can be modified to conform to IEEE 1149.1 architecture. A boundary BIST approach is described and compared to a purely scan operated boundary test approach.

Author

Lee Whetsel Senior Member Technical Staff
Vendor:
Texas Instruments, Inc.
Posted:
09 May 2000
Published:
01 Dec 1996
Format:
PDF
Length:
12 Page(s)
Type:
White Paper
Language:
English

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