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Electronic Inspection and Monitoring Instruments Reports
 
Improving regulatory compliance management through log analysis, SIM
sponsored by HP Enterprise Security
EGUIDE: This E-Guide highlights the importance of log analysis and security information and event management (SIEM) in improving regulatory compliance management.
Posted: 30 Mar 2012 | Published: 30 Mar 2012

HP Enterprise Security

LogRhythm and NERC CIP Compliance
sponsored by LogRhythm, Inc.
WHITE PAPER: LogRhythm has extensive experience in helping organizations improve their overall security and compliance posture while reducing costs, it automatically performs the first level of log analysis and also ensures you to meet your reporting requirements.
Posted: 25 Jul 2008 | Published: 01 Jul 2008

LogRhythm, Inc.

Strategic Planning for Enterprise-wide Test Automation
sponsored by CSC
WHITE PAPER: In this resource, discover how you can achieve large-scale test automation throughout the application lifecycle by leveraging a test automation platform. Read on to discover the features, benefits, and components of this technology.
Posted: 16 Sep 2013 | Published: 31 Dec 2012

CSC

Automation in Agile ALM: Interview with author Michael Hüttermann -- Part 1
sponsored by IBM
EGUIDE: Automation is often touted as a key in successful application development efforts, but it comes in many different flavors. This tip guide describes the variety of automation techniques and benefits of using automation throughout the application development lifecycle.
Posted: 28 Nov 2011 | Published: 07 Nov 2011

IBM

Six tips for selecting automated test tools for Agile development
sponsored by IBM
EGUIDE: With increased use of automation in application lifecycle management (ALM), the role of the tester is changing. In this tip guide managers will get advice on what to look for when selecting automated test tools and will learn more about how they may best want to invest their testing dollars in automation.
Posted: 28 Nov 2011 | Published: 07 Nov 2011

IBM

Built-in Self-test (BIST) Using Boundary Scan
sponsored by Texas Instruments, Inc.
WHITE PAPER: This document shows how existing architectures can be modified to conform to IEEE 1149.1 architecture.
Posted: 09 May 2000 | Published: 01 Dec 1996

Texas Instruments, Inc.

Design-for-Test Analysis of a Buffered SDRAM DIMM
sponsored by Texas Instruments, Inc.
WHITE PAPER: This document presents a design-for-test analysis of a buffered synchronous dynamic random access memory dual in-line memory module.
Posted: 11 Mar 2002 | Published: 13 Aug 1996

Texas Instruments, Inc.

IEEE 1149.1 Use in Design for Verification and Testability at Texas Instruments
sponsored by Texas Instruments, Inc.
WHITE PAPER: This document introduces those products that include ASIC cells, standard interface ICs, a bus master IC, a controller interface board for IBM compatibles, a high-speed scan interface, and software to control the scan bus.
Posted: 17 Mar 2002 | Published: 05 May 2000

Texas Instruments, Inc.

Is automated testing replacing the software tester?
sponsored by IBM
EGUIDE: With increased use of automation in application lifecycle management (ALM), the role of the tester is changing. In this tip guide managers will get advice on what to look for when selecting automated test tools and will learn more about how they may best want to invest their testing dollars in automation.
Posted: 28 Nov 2011 | Published: 07 Nov 2011

IBM

5 SAP HANA Implementation Tips CIOs Should Know
sponsored by SNP America, Inc.
EGUIDE: In this e-guide, Jawad Akhtar – long-time SAP expert in everything from SCM to products like HANA and Hybris – explores how to make your SAP HANA implementation successful. Uncover 5 tips to light your way towards a smooth, seamless SAP HANA adoption.
Posted: 29 Aug 2017 | Published: 22 Aug 2017

SNP America, Inc.
 

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