Circuit Design White Papers ( Integrated Circuit Design, Electronic Circuit Design, IC Design, Circuit Synthesis, Logic Design, Printed Circuit Design, Semiconductor Design ) Software Downloads, Definition and Webcasts

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Circuit Design
ALSO CALLED: Integrated Circuit Design, Electronic Circuit Design, IC Design, Circuit Synthesis, Logic Design, Printed Circuit Design, Semiconductor Design DEFINITION: SPICE (Simulation Program with Integrated Circuit Emphasis) is a computer program that simulates, verifies and predicts the behavior of circuits and circuit board designs. Commonly used in the development of integrated circuits (ICs), SPICE has become such an industry standard that simulation is often referred to as "SPICEing a circuit." Because the photolithography used in IC production … Circuit Design definition sponsored by WhatIs.com, powered by WhatIs.com an online computer dictionary
Circuit Design Reports
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Five Major Power Distribution Considerations for Data Center Racks sponsored by Avocent WHITE PAPER: Power densities and power consumption costs in data centers are rising. Learn what to consider when choosing the appropriate power distribution products at the rack level. Posted: 11 Feb 2008 \| Published: 01 Feb 2008 TOPICS: Capacitors \| Circuit Design \| Data Center Management \| Power Supplies \| Rack Enclosures \| Rack Servers

IEEE 1149.1 Use in Design for Verification and Testability at Texas Instruments sponsored by Texas Instruments, Inc. WHITE PAPER: This document introduces those products that include ASIC cells, standard interface ICs, a bus master IC, a controller interface board for IBM compatibles, a high-speed scan interface, and software to control the scan bus. Posted: 17 Mar 2002 \| Published: 05 May 2000 TOPICS: ASIC \| Circuit Design \| Integrated Circuit Test Equipment \| Standards \| Testing

Design-for-Test Analysis of a Buffered SDRAM DIMM sponsored by Texas Instruments, Inc. WHITE PAPER: This document presents a design-for-test analysis of a buffered synchronous dynamic random access memory dual in-line memory module. Posted: 11 Mar 2002 \| Published: 13 Aug 1996 TOPICS: Circuit Design \| DRAM \| Integrated Circuit Test Equipment \| RAM \| Testing

Built-in Self-test (BIST) Using Boundary Scan sponsored by Texas Instruments, Inc. WHITE PAPER: This document shows how existing architectures can be modified to conform to IEEE 1149.1 architecture. Posted: 09 May 2000 \| Published: 01 Dec 1996 TOPICS: Architectures \| Circuit Design \| Integrated Circuit Test Equipment \| Integrated Circuits \| Standards \| Testing

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