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Circuit Design Reports
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IEEE 1149.1 Use in Design for Verification and Testability at Texas Instruments sponsored by Texas Instruments, Inc. WHITE PAPER: This document introduces those products that include ASIC cells, standard interface ICs, a bus master IC, a controller interface board for IBM compatibles, a high-speed scan interface, and software to control the scan bus. Posted: 17 Mar 2002 \| Published: 05 May 2000 TOPICS: ASIC \| Circuit Design \| Integrated Circuit Test Equipment \| Standards \| Testing

Design-for-Test Analysis of a Buffered SDRAM DIMM sponsored by Texas Instruments, Inc. WHITE PAPER: This document presents a design-for-test analysis of a buffered synchronous dynamic random access memory dual in-line memory module. Posted: 11 Mar 2002 \| Published: 13 Aug 1996 TOPICS: Circuit Design \| DRAM \| Integrated Circuit Test Equipment \| RAM \| Testing

Built-in Self-test (BIST) Using Boundary Scan sponsored by Texas Instruments, Inc. WHITE PAPER: This document shows how existing architectures can be modified to conform to IEEE 1149.1 architecture. Posted: 09 May 2000 \| Published: 01 Dec 1996 TOPICS: Architectures \| Circuit Design \| Integrated Circuit Test Equipment \| Integrated Circuits \| Standards \| Testing

Circuit Design Reports