Electronics Diagnostic and Test Equipment

Electronics Diagnostic and Test Equipment White Papers (View All Report Types)
Built-in Self-test (BIST) Using Boundary Scan
sponsored by Texas Instruments, Inc.
WHITE PAPER: This document shows how existing architectures can be modified to conform to IEEE 1149.1 architecture.
Posted: 09 May 2000 | Published: 01 Dec 1996

Texas Instruments, Inc.

Design-for-Test Analysis of a Buffered SDRAM DIMM
sponsored by Texas Instruments, Inc.
WHITE PAPER: This document presents a design-for-test analysis of a buffered synchronous dynamic random access memory dual in-line memory module.
Posted: 11 Mar 2002 | Published: 13 Aug 1996

Texas Instruments, Inc.

IEEE 1149.1 Use in Design for Verification and Testability at Texas Instruments
sponsored by Texas Instruments, Inc.
WHITE PAPER: This document introduces those products that include ASIC cells, standard interface ICs, a bus master IC, a controller interface board for IBM compatibles, a high-speed scan interface, and software to control the scan bus.
Posted: 17 Mar 2002 | Published: 05 May 2000

Texas Instruments, Inc.

LogRhythm and NERC CIP Compliance
sponsored by LogRhythm, Inc.
WHITE PAPER: LogRhythm has extensive experience in helping organizations improve their overall security and compliance posture while reducing costs, it automatically performs the first level of log analysis and also ensures you to meet your reporting requirements.
Posted: 25 Jul 2008 | Published: 01 Jul 2008

LogRhythm, Inc.

Strategic Planning for Enterprise-wide Test Automation
sponsored by CSC
WHITE PAPER: In this resource, discover how you can achieve large-scale test automation throughout the application lifecycle by leveraging a test automation platform. Read on to discover the features, benefits, and components of this technology.
Posted: 16 Sep 2013 | Published: 31 Dec 2012

CSC