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Built-in Self-test (BIST) Using Boundary Scan
sponsored by Texas Instruments, Inc.
WHITE PAPER:
This document shows how existing architectures can be modified to conform to IEEE 1149.1 architecture.
Posted:
09 May 2000 |
Published:
01 Dec 1996
TOPICS:
Architectures
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Circuit Design
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Integrated Circuit Test Equipment
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Integrated Circuits
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Standards
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Testing
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