System Testing Reports

Rapid Bottleneck Identification - A Better Way to do Load Testing
sponsored by Oracle Corporation
WHITE PAPER: Rapid bottleneck identification (RBI) is a new testing methodology that allows quality assurance (QA) professionals to very quickly uncover Web application performance limitations and determine the impact of those limitations on the end user experience.
Posted: 12 Oct 2009 | Published: 01 Jun 2009

Oracle Corporation

National Instruments Synchronization and Memory Core - A Modern Architecture for Mixed Signal Test
sponsored by National Instruments
WHITE PAPER: By providing a common architecture for the 100 MS/s mixed-signal prototyping a test suite of instruments, the SMC enables the instruments to test systems where digital and analog signals are side by side.
Posted: 28 Aug 2003 | Published: 01 Jul 2003

National Instruments

Ixia Black Book: 802.11ac Wi-Fi Benchmarking
sponsored by Ixia
WHITE PAPER: Examine 802.11ac Wi-Fi test methodologies in this white paper, which provides insight into the capabilities and features that matter most.
Posted: 07 Mar 2014 | Published: 07 Mar 2014

Ixia

Softbank Mobile Overhauls its System Testing and Transforms Delivery of New Products
sponsored by Hewlett Packard Enterprise
CASE STUDY: Check out this brief case study to see how Softbank Mobile Corporation, one of Japan's leading mobile telecommunications providers, implemented a new system test standardization to ensure top-notch quality of all their business-critical applications and systems, at a fast pace and low cost.
Posted: 25 Jun 2013 | Published: 30 Sep 2012

Hewlett Packard Enterprise

Applying Updates for Dell PowerEdge Servers Using Microsoft Systems Management Server 2003 Part 2
sponsored by DellEMC and IntelĀ®
WHITE PAPER: Managing hardware updates is a key aspect of the MS Systems Management Server (SMS) 2003 with the introduction of the SMS 2003 Inventory Tool for Dell Update. This article provides guidelines for the process and is the final segment of a two part series.
Posted: 27 Jul 2006 | Published: 01 Jul 2006

DellEMC and IntelĀ®

The Next Frontier for Virtualization: Over-Utilized Systems: Identifying and eliminating the most critical and costly constraints from the enterprise software development and testing lifecycle
sponsored by iTKO LISA
WHITE PAPER: This article explains the utilization patterns in enterprise IT environments, and which type of Virtualization (Hardware or Service virtualization or both) should be applied to receive the greatest value. This paper discusses how to apply the principle of under and over-utilization to apply the right type of virtualization for business needs.
Posted: 20 Oct 2010 | Published: 20 Oct 2010

iTKO LISA

Solitaire Interglobal: Comparing Virtualization Methods for Business - Executive Summary
sponsored by IBM.
WHITE PAPER: Access this resource for a deep dive analysis of the business differentiators among x86, UNIX, and System z virtualization technologies to help you determine the right path for your data center.
Posted: 21 May 2013 | Published: 22 May 2012

IBM.

Testing Residential Cabling Systems
sponsored by Fluke Networks
APPLICATION NOTE: In commercial cabling, standards are well established for the testing and certification of structured wiring systems.
Posted: 28 Mar 2004 | Published: 01 Jan 2002

Fluke Networks

FAQ: Minimize SAP Testing Efforts
sponsored by IBM
PRESENTATION TRANSCRIPT: Trying to balance quality, speed and performance expectations is difficult enough, but when the pressure to deliver changes faster mounts, traditional QA and testing methods just don't cut it.Luckily, this resource is here to help - with answers to FAQs about how to minimize testing efforts in your SAP landscape.
Posted: 19 Jul 2013 | Published: 14 Jun 2013

IBM

NI TestStand 3.0 - Developing Automated Test Systems Faster and Smarter
sponsored by National Instruments
WHITE PAPER: Learn how TestStand 3.0 delivers continued innovation as the leading test management software among electronics manufacturers for automated prototype, validation, and manufacturing test systems.
Posted: 28 Aug 2003 | Published: 01 Jul 2003

National Instruments