Journey towards Zero Defects: Challenges, Best Practices and Testing Models

Journey towards Zero Defects: Challenges, Best Practices and Testing Models

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Organizations face different challenges at different levels of testing maturity. Testing Maturity Model (TMM) and Test Process Improvement (TPI) are two of the contemporary testing maturity models. Organizations that apply them would reap benefits and migrate to a higher level of maturity and better quality.

This white paper gives pointers to some of the best practices which can be followed by organizations for their testing activities and introduces TMM and TPI. It discusses the journey of a group from a stage when testing was not considered a separate activity to a stage where a number of activities take place under the scope of testing. It will highlight the challenges/issues faced at each stage and what were the incremental improvements made to overcome each hurdle till the vision of high quality was achieved.

Download Journey Towards Zero Defects: Challenges, Best Practices and Testing Models now.

Vendor:
Wipro
Posted:
Feb 8, 2021
Published:
Nov 1, 2005
Format:
PDF
Type:
White Paper

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