sponsored by National Instruments
Posted:  28 Aug 2003
Published:  01 Jul 2003
Format:  PDF
Length:  14  Page(s)
Type:  White Paper
Language:  English

By providing a common architecture for the 100 MS/s mixed-signal prototyping a test suite of instruments, the SMC enables the instruments to test systems where digital and analog signals are side by side. Emphasis on tight timing and synchronization, deep and flexible onboard memory, and fully programmable data transfer cores, makes the SMC an excellent foundation for a mixed-signal modular instrumentation test platform for today and the future.

Architectures | Diagnostic and Test Hardware | Hardware Testing | Memory | Prototyping | Systems Testing

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