National Instruments Synchronization and Memory Core - A Modern Architecture for Mixed Signal Test

National Instruments Synchronization and Memory Core - A Modern Architecture for Mixed Signal Test

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By providing a common architecture for the 100 MS/s mixed-signal prototyping a test suite of instruments, the SMC enables the instruments to test systems where digital and analog signals are side by side. Emphasis on tight timing and synchronization, deep and flexible onboard memory, and fully programmable data transfer cores, makes the SMC an excellent foundation for a mixed-signal modular instrumentation test platform for today and the future.

Vendor:
National Instruments
Posted:
28 Aug 2003
Published
01 Jul 2003
Format:
PDF
Length:
14 Page(s)
Type:
White Paper
Language:
English
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