Detect anomalies in manufacturing with machine learning

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This paper describes a multivariate machine learning solution that has been developed for semiconductor customers using the TIBCO Connected Intelligence Platform.

The solution alerts when there are multiple clusters of product with distinctly different test characteristics. The approach outlined has applicability to detect anomalous equipment, processes, and products beyond this specific example.

Read the full white paper to learn more.

Vendor:
TIBCO
Posted:
Dec 9, 2021
Published:
Dec 3, 2021
Format:
HTML
Type:
White Paper
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