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Installation Testing Reports
 
Rapid Bottleneck Identification - A Better Way to do Load Testing
sponsored by Oracle Corporation
WHITE PAPER: Rapid bottleneck identification (RBI) is a new testing methodology that allows quality assurance (QA) professionals to very quickly uncover Web application performance limitations and determine the impact of those limitations on the end user experience.
Posted: 12 Oct 2009 | Published: 01 Jun 2009

Oracle Corporation

The Systems Management Buyer’s Guide: Five Keys to Low Total Cost of Ownership for Midsized Businesses
sponsored by Hitachi Data Systems
WHITE PAPER: This white paper examines the five key characteristics of software that can meet these challenges successfully, and specifically considers the capability of Hitachi IT Operations Analyzer software to meet these challenges.
Posted: 05 Oct 2009 | Published: 01 Sep 2009

Hitachi Data Systems

Testing Residential Cabling Systems
sponsored by Fluke Networks
APPLICATION NOTE: In commercial cabling, standards are well established for the testing and certification of structured wiring systems.
Posted: 28 Mar 2004 | Published: 01 Jan 2002

Fluke Networks

The Next Frontier for Virtualization: Over-Utilized Systems: Identifying and eliminating the most critical and costly constraints from the enterprise software development and testing lifecycle
sponsored by iTKO LISA
WHITE PAPER: This article explains the utilization patterns in enterprise IT environments, and which type of Virtualization (Hardware or Service virtualization or both) should be applied to receive the greatest value. This paper discusses how to apply the principle of under and over-utilization to apply the right type of virtualization for business needs.
Posted: 20 Oct 2010 | Published: 20 Oct 2010

iTKO LISA

NI TestStand 3.0 - Developing Automated Test Systems Faster and Smarter
sponsored by National Instruments
WHITE PAPER: Learn how TestStand 3.0 delivers continued innovation as the leading test management software among electronics manufacturers for automated prototype, validation, and manufacturing test systems.
Posted: 28 Aug 2003 | Published: 01 Jul 2003

National Instruments

System Grounding and Ground-Fault Protection Methods for UPS-Supplied Power Systems
sponsored by Square D Critical Power Competency Center
WHITE PAPER: This paper explores the nature of circulating currents in UPS-supplied power systems when solid system grounding is employed and the use of modified-differential ground fault protection to eliminate the effects of these circulating currents.
Posted: 12 Feb 2009 | Published: 12 Feb 2009

Square D Critical Power Competency Center

Solitaire Interglobal: Comparing Virtualization Methods for Business - Executive Summary
sponsored by IBM.
WHITE PAPER: Access this resource for a deep dive analysis of the business differentiators among x86, UNIX, and System z virtualization technologies to help you determine the right path for your data center.
Posted: 21 May 2013 | Published: 22 May 2012

IBM.

Intel® Xeon® Processor 7300 Series
sponsored by Intel Corporation
PRODUCT OVERVIEW: Based on the Intel® Core™ microarchitecture, the Intel Xeon processor 7300 series offers leading scalable performance and best-in-class virtualization for server consolidation.
Posted: 21 Nov 2007 | Published: 01 Nov 2007

Intel Corporation

Trend Micro Deep Security 7.5 vs. McAfee and Symantec
sponsored by Trend Micro, Inc.
TEST RESULTS: Server and desktop virtualization are essential elements of any IT strategy that seeks to decrease capital and operational expenditures. In the rush to implement virtualization technologies, many organizations simply deploy the same anti-virus solution that is in use on their physical server and desktop systems.
Posted: 18 Feb 2011 | Published: 17 Feb 2011

Trend Micro, Inc.

Lowering the Cost of Test with Integrated Switch Management
sponsored by National Instruments
WHITE PAPER: National Instruments Switch Executive is a significant innovation in the design and implementation of automated test systems.
Posted: 02 Sep 2002 | Published: 01 Feb 2002

National Instruments
 
 
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