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This paper describes a multivariate machine learning solution that has been developed for semiconductor customers using the TIBCO Connected Intelligence Platform.

The solution alerts when there are multiple clusters of product with distinctly different test characteristics. The approach outlined has applicability to detect anomalous equipment, processes, and products beyond this specific example.

Read the full white paper to learn more.

Vendor:

TIBCO

Posted:

Dec 9, 2021

Published:

Dec 3, 2021

Format:

HTML

Type:

White Paper