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Achieving Latency and Reliability Targets with QLC in Enterprise Controllers
The 3D QLC NAND flash memory characteristics exhibit remarkable challenges in terms of latency and reliability resulting in an unassertive adoption in the enterprise storage market.
This demonstrates that through an innovative controller design and novel flash management algorithms these challenges can be effectively mitigated. Inside see experimental results that demonstrate the improvements from various read voltage calibration and data placement schemes and discuss the specific trade-offs in accuracy and controller complexity of such schemes.
The findings demonstrate that implementing these techniques in a QLC controller not only achieves TLC-like performance but can even outperform traditional TLC controller designs which are widespread in enterprise storage systems today.