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Built-in Self-test (BIST) Using Boundary Scan
sponsored by Texas Instruments, Inc.
WHITE PAPER: This document shows how existing architectures can be modified to conform to IEEE 1149.1 architecture.
Posted: 09 May 2000 | Published: 01 Dec 1996

Texas Instruments, Inc.

Embedded Security: Trusted Platform Module Technology Comes of Age
sponsored by Utimaco Safeware
WHITE PAPER: This paper examines the benefits that TPM chips bring to security-conscious businesses, and the ways in which this technology can elevate trusted computing to higher levels, enhancing security while simplifying usability.
Posted: 02 Feb 2009 | Published: 01 Dec 2005

Utimaco Safeware

Dell™Reliable Memory Technology
sponsored by Dell, Inc.
WHITE PAPER: This paper examines the root causes of memory errors and discusses and discusses the core concepts of technology designed to remediate and obviate these errors.
Posted: 12 Mar 2014 | Published: 12 Mar 2014

Dell, Inc.

Reliability Analysis of the APC Symmetra MW Power System
sponsored by APC by Schneider Electric
WHITE PAPER: MTechnology, Inc. (MTech) performed a quantitative reliability analysis of the APC Symmetra MW UPS. The study used techniques of Probabilistic Risk Assessment (PRA) to calculate the likelihood of over 680,000 potential failure modes.
Posted: 28 Jan 2010 | Published: 28 Jan 2010

APC by Schneider Electric

Virtualization Gets Down to Business as a Wellspring of Agility
sponsored by Dell, Inc. and AMD
EBOOK: This e-book, sponsored by Dell, Inc. and AMD, contains a variety of virtualization resources as well as product overviews and videos detailing the features and business benefits of AMD processors and Dell virtualization solutions.
Posted: 13 Sep 2010 | Published: 13 Sep 2010

Dell, Inc. and AMD

Handbook: Converged network, storage and compute infrastructure: Are we there yet?
sponsored by SearchNetworking.com
EGUIDE: Access this expert e-guide to learn how you can make a converged network infrastructure a reality and achieve top efficiency.
Posted: 19 Sep 2013 | Published: 19 Sep 2013

SearchNetworking.com

Presentation Transcript: Best Practices in Batch Tuning - Empowering IT Staff to Reduce CPU and Run-Time in the Enterprise
sponsored by Software Engineering of America, Inc.
PRESENTATION TRANSCRIPT: Read this presentation transcript to learn how batch tuning can enable your organization to reduce required computing resources and save valuable run-time, ultimately saving money for the enterprise. Gain insight into common problems data center pros run into when implementing batch tuning, and explore tools to overcome these challenges.
Posted: 18 Feb 2010 | Published: 18 Feb 2010

Software Engineering of America, Inc.

Improve Datacenter Efficiency by Refreshing Sun SPARC/Solaris Servers
sponsored by Oracle Corporation
WEBCAST: Oracle's Tom Atwood, Senior Principal Product Director and Gary Combs, SPARC Specialist discuss how you can refresh legacy systems onto the latest server technology and take advantage of virtualization techniques to help you build an efficient, agile datacenter.
Posted: 11 Mar 2011 | Premiered: Mar 11, 2011

Oracle Corporation

ACP- The Truth About Power Consumption Starts Here
sponsored by Dell, Inc. and AMD
WHITE PAPER: Based on customer demands, one company as developed a new metric designed to give customers a more accurate idea of the power consumed by the processor, thus enabling the customer to more accurately plan for future power budgets.
Posted: 24 Aug 2011 | Published: 24 Aug 2011

Dell, Inc. and AMD

Barcodes vs RFID: The pros and cons of each side reviewed
sponsored by IQMS
EGUIDE: This e-guide reviews the pros and cons of bar code technology, and addresses niche areas where radio frequency identification (RFID) is gaining traction.
Posted: 02 Oct 2013 | Published: 02 Oct 2013

IQMS
 
 
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