A Rational approach to integration testing
sponsored by IBM
WHITE PAPER:
Learn strategic approaches to integration testing that will mitigate the risks of system change and improve quality.
Posted: 27 Aug 2012 | Published: 31 Jul 2012
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Deployment Without Downtime for Dynamic Implementations
sponsored by Transitional Data Services
WHITE PAPER:
Read this white paper to explore 16 critical questions to ask that will tell you if your organization is falling victim to six common traps and risks inherent within dynamic testing environments. If so, discover how automated build and configuration management capabilities can help you recover the agility you need.
Posted: 05 Feb 2013 | Published: 05 Feb 2013
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Silk Test, the bug buster: Automate test scripts for multiple applications and networks
sponsored by Borland, Micro Focus
WHITE PAPER:
This white paper introduces an automated testing technology that makes application testing fast, easy, and accessible for even the most non-technical users.
Posted: 06 May 2013 | Published: 06 May 2013
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Built-in Self-test (BIST) Using Boundary Scan
sponsored by Texas Instruments, Inc.
WHITE PAPER:
This document shows how existing architectures can be modified to conform to IEEE 1149.1 architecture.
Posted: 09 May 2000 | Published: 01 Dec 1996
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Design-for-Test Analysis of a Buffered SDRAM DIMM
sponsored by Texas Instruments, Inc.
WHITE PAPER:
This document presents a design-for-test analysis of a buffered synchronous dynamic random access memory dual in-line memory module.
Posted: 11 Mar 2002 | Published: 13 Aug 1996
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Eradicate Cross-Site Scripting
sponsored by Veracode, Inc.
WHITE PAPER:
The rise of e-commerce has generated a concurrent surge of Internet crime into a multi-billion-a-year industry, as criminals follow the money, the countless potential online victims and the vulnerability of web applications to easy exploitation.
Posted: 28 Feb 2011 | Published: 28 Feb 2011
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IEEE 1149.1 Use in Design for Verification and Testability at Texas Instruments
sponsored by Texas Instruments, Inc.
WHITE PAPER:
This document introduces those products that include ASIC cells, standard interface ICs, a bus master IC, a controller interface board for IBM compatibles, a high-speed scan interface, and software to control the scan bus.
Posted: 17 Mar 2002 | Published: 05 May 2000
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LogRhythm and NERC CIP Compliance
sponsored by LogRhythm, Inc.
WHITE PAPER:
LogRhythm has extensive experience in helping organizations improve their overall security and compliance posture while reducing costs, it automatically performs the first level of log analysis and also ensures you to meet your reporting requirements.
Posted: 25 Jul 2008 | Published: 01 Jul 2008
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ELECTRONICS DIAGNOSTIC AND TEST EQUIPMENT DEFINITION (continued): … Automated test equipment (ATE) is computer-controlled equipment that testselectronic devices for functionality and performance. ATE also conducts stress testing with minimal human interaction. ATE includes the control hardware, sensors, and software that collects and analyzes the test results. ATE is considered cost efficient for high-volume testing.Automated test equipment uses a range of sensing techniques, including machine vision. In addition to the semiconductor industry, ATE is used in the automotive, medical equipment, airplane, and other manufacturing industries. Electronics Diagnostic and Test Equipment definition sponsored by SearchSoftwareQuality.com, powered by WhatIs.com an online computer dictionary
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