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Automatic Test Pattern Generators

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ALSO CALLED: Pattern Generators, Automatic Pattern Generators, ATPG
DEFINITION: Used in the testing and evaluation of the reliability and quality of a digital Integrated Circuit. Software and hardware tools are used to generate an appropriate subset of all input combinations, such that a desired percentage of faults is activated and observed at the outputs.
Automatic Test Pattern GeneratorsWhite Papers (View All Report Types)
2 Matches
A Rational approach to integration testing
sponsored by IBM
WHITE PAPER: Learn strategic approaches to integration testing that will mitigate the risks of system change and improve quality.
Posted: 27 Aug 2012 | Published: 31 Jul 2012

IBM

Strategic Planning for Enterprise-wide Test Automation
sponsored by CSC
WHITE PAPER: In this resource, discover how you can achieve large-scale test automation throughout the application lifecycle by leveraging a test automation platform. Read on to discover the features, benefits, and components of this technology.
Posted: 16 Sep 2013 | Published: 31 Dec 2012

CSC
2 Matches
 
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