Going Parallel with LabVIEW Delivers Throughput Gains

Going Parallel with LabVIEW Delivers Throughput Gains

Cover
Frank Lloyd Wright, an influential 20th century architect, once said, "Every great architect must be a great original interpreter of his time, his day, his age." The same can be said for test system architects. They must interpret evolving technologies, such as multicore processors, field-programmable gate arrays (FPGAs), and high-speed data buses like PCI Express, as they design, develop, and implement the systems they have been commissioned to build. By combining these technologies with NI LabVIEW parallel programming software and NI TestStand test management software, test engineers can create high-performance test systems capable of parallel processing, parallel measurements, and even completely parallel test on the production floor. By going parallel with PC-based technologies, you can test devices up to 10 times faster than traditional instrumentation.
Vendor:
National Instruments
Posted:
16 Sep 2008
Published:
16 Sep 2008
Format:
PDF
Length:
7 Page(s)
Type:
White Paper
Language:
English
Already a Bitpipe member? Login here

Download this White Paper!

By submitting you agree to receive email from TechTarget and its partners. If you reside outside of the United States, you consent to having your personal data transferred to and processed in the United States. Privacy