Advanced RFID Measurements: Basic Theory to Protocol Conformance Test

Advanced RFID Measurements: Basic Theory to Protocol Conformance Test

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As RFID adoption continues to grow, engineers are faced with an increasing need to validate tags both for interoperability with products from other vendors and for conformance with the specified protocol. In today's market, these test needs are coupled with increasing pressure to improve tag performance. As one might expect, RFID system designers face a significant test challenge when attempting to meet the needs of this emerging market. Fortunately, the demand for RFID technology has spawned both significant industry grown and innovation. In fact, researchers in both the research and commercial environment have often elected to use National Instruments measurement equipment to characterize both tag and reader performance.

Vendor:
National Instruments
Posted:
21 Jul 2008
Published
01 Jan 2006
Format:
PDF
Length:
24 Page(s)
Type:
White Paper
Language:
English
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